Tehranipoor, Mohammad: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

1

Cybersecurity Standards: Managing Risk and Creating Resilience

Collier, Zachary A., DiMase, Daniel, Walters, Steve, Tehranipoor, Mark Mohammad, Lambert, James H., Linkov, Igor

Journal:

Year:

2014

Language:

english

File:

PDF, 476 KB

english, 2014

2

[IEEE 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Arlington, VA, USA (2014.5.6-2014.5.7)] 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Bit selection algorithm suitable for high-volume production of SRAM-PUF

Xiao, Kan, Rahman, Md. Tauhidur, Forte, Domenic, Huang, Yu, Su, Mei, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 1.62 MB

english, 2014

3

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead

Guin, Ujjwal, DiMase, Daniel, Tehranipoor, Mohammad

Journal:

Journal of Electronic Testing

Year:

2014

Language:

english

File:

PDF, 671 KB

english, 2014

4

Test and Diagnosis for Small-Delay Defects || Introduction to Diagnosis

Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

Year:

2012

Language:

english

File:

PDF, 636 KB

english, 2012

5

Protection Against Hardware Trojan Attacks: Towards a Comprehensive Solution

Bhunia, Swarup, Abramovici, Miron, Agrawal, Dakshi, Bradley, Paul, Hsiao, Michael S., Plusquellic, Jim, Tehranipoor, Mohammad

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 1016 KB

english, 2013

6

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - Advanced Analysis of Cell Stability for Reliable SRAM PUFs

Hosey, Alison, Rahman, Md. Tauhidur, Xiao, Kan, Forte, Domenic, Tehranipoor, Mohammad

Year:

2014

File:

PDF, 3.19 MB

2014

7

A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time

Salmani, Hassan, Tehranipoor, Mohammad, Plusquellic, Jim

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2012

Language:

english

File:

PDF, 2.49 MB

english, 2012

8

A Survey of Hardware Trojan Taxonomy and Detection

Tehranipoor, Mohammad, Koushanfar, Farinaz

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 975 KB

english, 2013

9

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Transition delay fault test pattern generation considering supply voltage noise in a SOC design

Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, Vinay

Year:

2007

Language:

english

File:

PDF, 635 KB

english, 2007

10

Built-in self-test and recovery procedures for molecular electronics-based nanofabrics

Tehranipoor, Mohammad, P. Rad, Reza M.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2007

File:

PDF, 5.69 MB

2007

11

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Special session 5B: Panel How much toggle activity should we be testing with?

Wen, Xiaoqing, Tehranipoor, Mohammad, Kapur, Rohit, Bhat, Anand, Majumdar, Amitava, Winemberg, LeRoy

Year:

2011

Language:

english

File:

PDF, 56 KB

english, 2011

12

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - ARO-PUF: An aging-resistant ring oscillator PUF design

Rahman, Md. Tauhidur, Forte, Domenic, Fahrny, Jim, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 163 KB

english, 2014

13

Introduction to Hardware Security and Trust || Protecting IPs Against Scan-Based Side-Channel Attacks

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 311 KB

english, 2012

14

Introduction to Hardware Security and Trust || Security Based on Physical Unclonability and Disorder

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 716 KB

english, 2012

15

[ACM Press the 48th Design Automation Conference - San Diego, California (2011.06.05-2011.06.10)] Proceedings of the 48th Design Automation Conference on - DAC '11 - In-field aging measurement and calibration for power-performance optimization

Wang, Shuo, Tehranipoor, Mohammad, Winemberg, LeRoy

Year:

2011

Language:

english

File:

PDF, 799 KB

english, 2011

16

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Power-safe test application using an effective gating approach considering current limits

Zhao, Wei, Tehranipoor, Mohammad, Chakravarty, Sreejit

Year:

2011

Language:

english

File:

PDF, 4.09 MB

english, 2011

17

Test and Diagnosis for Small-Delay Defects || Long Path-Based Hybrid Method

Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

Year:

2012

Language:

english

File:

PDF, 1.04 MB

english, 2012

18

[IEEE 2010 5th International Design and Test Workshop (IDT) - Abu Dhabi, United Arab Emirates (2010.12.14-2010.12.15)] 2010 5th International Design and Test Workshop - Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG

Ma, Junxia, Tehranipoor, Mohammad, Sinanoglu, Ozgur, Almukhaizim, Sobeeh

Year:

2010

Language:

english

File:

PDF, 639 KB

english, 2010

19

Introduction to Hardware Security and Trust || Secure Hardware IPs by Digital Watermark

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 444 KB

english, 2012

20

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Aging analysis for recycled FPGA detection

Dogan, Halit, Forte, Domenic, Tehranipoor, Mark Mohammad

Year:

2014

Language:

english

File:

PDF, 1.43 MB

english, 2014

21

Guest Editorial

Mohammad Tehranipoor

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 64 KB

english, 2007

22

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Critical Fault-Based Pattern Generation for Screening SDDs

Bao, Fang, Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Winemberg, LeRoy, Tehranipoor, Mohammad

Year:

2011

Language:

english

File:

PDF, 418 KB

english, 2011

23

Evaluating area and performance of hybrid FPGAs with nanoscale clusters and CMOS routing

Rad, Reza M.P., Tehranipoor, Mohammad

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Year:

2007

Language:

english

File:

PDF, 602 KB

english, 2007

24

[ACM Press the great lakes symposium - Salt Lake City, Utah, USA (2012.05.03-2012.05.04)] Proceedings of the great lakes symposium on VLSI - GLSVLSI '12 - A zero-overhead IC identification technique using clock sweeping and path delay analysis

Tuzzio, Nicholas, Xiao, Kan, Zhang, Xuehui, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 816 KB

english, 2012

25

Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults

Bao, Fang, Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Winemberg, LeRoy, Tehranipoor, Mohammad

Journal:

Journal of Electronic Testing

Year:

2013

Language:

english

File:

PDF, 1.03 MB

english, 2013

26

[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices

Rad, Reza, Tehranipoor, Mohammad

Year:

2006

Language:

english

File:

PDF, 236 KB

english, 2006

27

Nanometer Technology Designs High-Quality Delay Tests || Screening Small Delay Defects

Tehranipoor, Mohammad, Ahmed, Nisar

Year:

2008

Language:

english

File:

PDF, 357 KB

english, 2008

28

A Sensor-Assisted Self-Authentication Framework for Hardware Trojan Detection

Davoodi, Azadeh, Min Li,, Tehranipoor, Mohammad

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 142 KB

english, 2013

29

Introduction to Hardware Security and Trust ||

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 10.90 MB

english, 2012

30

[IEEE 2011 International Green Computing Conference (IGCC) - Orlando, FL, USA (2011.07.25-2011.07.28)] 2011 International Green Computing Conference and Workshops - Peak power identification on power bumps during test application

Wei Zhao,, Tehranipoor, Mohammad

Year:

2011

Language:

english

File:

PDF, 4.98 MB

english, 2011

31

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - High-quality pattern selection for screening small-delay defects considering process variations and crosstalk

Ke Peng,, Yilmaz, Mahmut, Tehranipoor, Mohammad, Chakrabarty, Krishnendu

Year:

2010

Language:

english

File:

PDF, 400 KB

english, 2010

32

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage

Bao, Fang, Peng, Ke, Chakrabarty, Krishnendu, Tehranipoor, Mohammad

Year:

2011

File:

PDF, 1.81 MB

2011

33

Local at-speed scan enable generation for transition fault testing using low-cost testers

Ahmed, Nisar, Tehranipoor, Mohammad, Ravikumar, C. P., Butler, Kenneth M.

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2007

File:

PDF, 557 KB

2007

34

[Frontiers in Electronic Testing] Emerging Nanotechnologies Volume 37 || Reversible and Testable Circuits for Molecular QCA Design

Tehranipoor, Mohammad

Year:

2008

Language:

english

File:

PDF, 451 KB

english, 2008

35

Adaptation and Evaluation of the Output-Deviations Metric to Target Small-Delay Defects in Industrial Circuits

Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad

Journal:

IEEE Design & Test of Computers

Year:

2011

Language:

english

File:

PDF, 220 KB

english, 2011

36

Layout-Aware Switching Activity Localization to Enhance Hardware Trojan Detection

Salmani, Hassan, Tehranipoor, Mohammad

Journal:

IEEE Transactions on Information Forensics and Security

Year:

2012

Language:

english

File:

PDF, 1.69 MB

english, 2012

37

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests

Chen, Jifeng, Winemberg, LeRoy, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 1.40 MB

english, 2014

38

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - A novel method for fast identification of peak current during test

Zhao, Wei, Chakravarty, Sreejit, Ma, Junxia, Devta-Prasanna, Narendra, Fan Yang,, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 2.13 MB

english, 2012

39

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements

Wang, Xiaoxiao, Tran, Dat, George, Saji, Winemberg, LeRoy, Ahmed, Nisar, Palosh, Steve, Dobin, Allan, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 537 KB

english, 2012

40

[IEEE 2015 16th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2015.3.2-2015.3.4)] Sixteenth International Symposium on Quality Electronic Design - LBIST pattern reduction by learning ATPG test cube properties

Contreras, Gustavo K., Zhao, Yang, Ahmed, Nisar, Winemberg, LeRoy, Tehranipoor, Mohammad

Year:

2015

Language:

english

File:

PDF, 525 KB

english, 2015

41

Test and Diagnosis for Small-Delay Defects || Delay Test and Small-Delay Defects

Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

Year:

2012

Language:

english

File:

PDF, 543 KB

english, 2012

42

A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay

Kan Xiao,, Xuehui Zhang,, Tehranipoor, Mohammad

Journal:

IEEE Design and Test

Year:

2013

Language:

english

File:

PDF, 633 KB

english, 2013

43

[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - LS-TDF: Low-Switching Transition Delay Fault Pattern Generation

Lee, Jeremy, Tehranipoor, Mohammad

Year:

2008

Language:

english

File:

PDF, 278 KB

english, 2008

44

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Special session: Hot topic: Smart silicon

Winemberg, LeRoy, Tehranipoor, Mohammad

Year:

2011

Language:

english

File:

PDF, 351 KB

english, 2011

45

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation

Lee, Jeremy, Narayan, Sumit, Kapralos, Mike, Tehranipoor, Mohammad

Year:

2008

Language:

english

File:

PDF, 304 KB

english, 2008

46

[IEEE 2013 14th International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2013.12.11-2013.12.13)] 2013 14th International Workshop on Microprocessor Test and Verification - Anti-counterfeit Techniques: From Design to Resign

Guin, Ujjwal, Forte, Domenic, Tehranipoor, Mohammad

Year:

2013

Language:

english

File:

PDF, 406 KB

english, 2013

47

[IEEE 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - New York City, NY, USA (2013.10.2-2013.10.4)] 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) - Secure Split-Test for preventing IC piracy by untrusted foundry and assembly

Contreras, Gustavo K., Rahman, Md. Tauhidur, Tehranipoor, Mohammad

Year:

2013

Language:

english

File:

PDF, 883 KB

english, 2013

48

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - CSST: Preventing distribution of unlicensed and rejected ICs by untrusted foundry and assembly

Rahman, Md. Tauhidur, Forte, Domenic, Shi, Quihang, Contreras, Gustavo K., Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 391 KB

english, 2014

49

Introduction to Hardware Security and Trust || Hardware Implementation of Hash Functions

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 529 KB

english, 2012

50

[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Timing-based delay test for screening small delay defects

Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, Vinay

Year:

2006

Language:

english

File:

PDF, 644 KB

english, 2006

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски